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Simulations of Vertical GaN Diode Performance Under Electron Beam Radiation Exposures

Matthew J. Jasica, William R. Wampler, Barney L. Doyle, Greg W. Pickrell, William Cowan, Albert Colon, Michael Van Heukelom, Caleb E. Glaser (Sandia)

Transactions / Volume 121 / Number 1 / November 2019 / Pages 21-24