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2025 ANS Winter Conference & Expo
November 9–12, 2025
Washington, DC|Washington Hilton
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Supplier Showcase focus: Reducing cumulative radiological exposure
The American Nuclear Society is hosting a new Supplier Showcase webinar, “Reducing Cumulative Radiological Exposure with Advanced Source Term Removal Technologies,” on October 15 from 2:00 p.m. to 3:00 p.m. (EDT) on recent advancements in decontamination technology.
The webinar is free for all viewers and requires registration.
K. N. Prasad, W. A. Jester, F. J. Remick
Nuclear Technology | Volume 24 | Number 2 | November 1974 | Pages 252-259
Technical Paper | Analysis | doi.org/10.13182/NT74-A31481
Articles are hosted by Taylor and Francis Online.
Post-cutting chip activation analysis has been developed for the study of tool wear. In this technique, chips produced during machining are analyzed by neutron activation for a tracer that occurs in the tool. Tungsten was used as a tracer that was inherently present in the tool, and europium was used as a tracer that was added to the tool during its production. It was found that europium fails to effectively meet all the requirements of a tracer in the tool. By using the tungsten in high-speed steel tools and Ti—6Al—4 V alloy work material, it was shown that (a) a random selection of chips was ineffective in providing useful tool wear information and (b) the traditionally ignored break-in period of tool wear could be used to predict tool life to within the same margin of error as conventional methods, but with potential savings in time and cost.