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The Radiation Protection and Shielding Division is developing and promoting radiation protection and shielding aspects of nuclear science and technology — including interaction of nuclear radiation with materials and biological systems, instruments and techniques for the measurement of nuclear radiation fields, and radiation shield design and evaluation.
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ANS Student Conference 2025
April 3–5, 2025
Albuquerque, NM|The University of New Mexico
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General Kenneth Nichols and the Manhattan Project
Nichols
The Oak Ridger has published the latest in a series of articles about General Kenneth D. Nichols, the Manhattan Project, and the 1954 Atomic Energy Act. The series has been produced by Nichols’ grandniece Barbara Rogers Scollin and Oak Ridge (Tenn.) city historian David Ray Smith. Gen. Nichols (1907–2000) was the district engineer for the Manhattan Engineer District during the Manhattan Project.
As Smith and Scollin explain, Nichols “had supervision of the research and development connected with, and the design, construction, and operation of, all plants required to produce plutonium-239 and uranium-235, including the construction of the towns of Oak Ridge, Tennessee, and Richland, Washington. The responsibility of his position was massive as he oversaw a workforce of both military and civilian personnel of approximately 125,000; his Oak Ridge office became the center of the wartime atomic energy’s activities.”
Hajime Furuichi, Kenichi Katono, Yuki Mizushima, Toshiyuki Sanada
Nuclear Science and Engineering | Volume 197 | Number 11 | November 2023 | Pages 2950-2960
Regular Research Article | doi.org/10.1080/00295639.2023.2180986
Articles are hosted by Taylor and Francis Online.
This study aims to improve the measurement accuracy of liquid film thickness using a liquid film sensor with an optical waveguide film (OWF). The measurement principle of employing the OWF is based on the detection of light reflection at the liquid film surface with high spatial resolution. Because the curved surface of the liquid film reflects light and increases measurement error, we propose a signal processing method to remove the error factor in the calculation of the time-averaged thickness. This method requires prediction of the surface curvature, and we numerically investigated the characteristics of the output signal related to the reflected light intensity. The analysis results showed that the effect of the curved surface up to the surface curvature of 5.0 mm−1 was negligible because the liquid film thickness showed good agreement with that of the flat liquid film surface within 7% accuracy. Furthermore, we consider the applicable range of liquid film thicknesses under the operating conditions of boiling water reactors (BWRs). We estimated the surface curvature of the liquid film based on the calculation of the critical Weber number and confirmed that the curvature caused under the BWR operating conditions was covered by the analysis conditions of this study. Therefore, our proposed method for signal processing via the OWF enabled us to improve the measurement accuracy of the time-averaged thickness with respect to the base film thickness by extracting accurate surface curvature data.