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Fusion Science and Technology
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General Kenneth Nichols and the Manhattan Project
Nichols
The Oak Ridger has published the latest in a series of articles about General Kenneth D. Nichols, the Manhattan Project, and the 1954 Atomic Energy Act. The series has been produced by Nichols’ grandniece Barbara Rogers Scollin and Oak Ridge (Tenn.) city historian David Ray Smith. Gen. Nichols (1907–2000) was the district engineer for the Manhattan Engineer District during the Manhattan Project.
As Smith and Scollin explain, Nichols “had supervision of the research and development connected with, and the design, construction, and operation of, all plants required to produce plutonium-239 and uranium-235, including the construction of the towns of Oak Ridge, Tennessee, and Richland, Washington. The responsibility of his position was massive as he oversaw a workforce of both military and civilian personnel of approximately 125,000; his Oak Ridge office became the center of the wartime atomic energy’s activities.”
Brian M. Patterson, Steven G. Young, Tana Morrow, Thomas Day, Derek Schmidt, Nikolaus L. Cordes
Fusion Science and Technology | Volume 79 | Number 7 | October 2023 | Pages 895-906
Research Article | doi.org/10.1080/15361055.2023.2185030
Articles are hosted by Taylor and Francis Online.
X-ray computed tomography (CT) is widely used in material science to understand the inner morphology of a specimen. Often, it is used to qualitatively understand the distribution of salient features such as cracks, voids, or particles. There are many challenges in using X-ray CT in a quantitative manner. These include a coarser resolution for comparable fields of view when compared to other imaging techniques (i.e., electron or optical microscopy), imaging artifacts (i.e., beam hardening and phase contrast), and the plethora of imaging and processing parameters that are chosen by the instrument/software user that can significantly affect the resultant measures. These limitations must be considered and quantified to acquire accurate and precise measurements. X-ray CT is powerful in that it can measure, in three dimensions, salient features that are subsurface and cannot be imaged with other direct line-of-sight imaging techniques. In this work, we discuss the use of X-ray CT to measure the thickness variations of thin walls of opacity capsules as well as the measurement of double-shell targets to understand the concentricity of the capsules within each other. Morphological measurements needed for target characterization require very high accuracy and precision. This paper will describe the application for the first time of a variety of measurements and will explore their robustness and pros and cons to identify areas of research to improve their accuracy and precision.