ANS is committed to advancing, fostering, and promoting the development and application of nuclear sciences and technologies to benefit society.
Explore the many uses for nuclear science and its impact on energy, the environment, healthcare, food, and more.
Explore membership for yourself or for your organization.
Conference Spotlight
2026 ANS Annual Conference
May 31–June 3, 2026
Denver, CO|Sheraton Denver
Latest Magazine Issues
Mar 2026
Jan 2026
Latest Journal Issues
Nuclear Science and Engineering
April 2026
Nuclear Technology
February 2026
Fusion Science and Technology
Latest News
DOE announces Genesis Mission request for applications
Ian Buck, Nvidia’s vice president of hyperscale and HPC computing (left), and Darío Gil, DOE Under Secretary for Science and Genesis Mission lead, at the Nvidia GPU Technology Conference. (Photo: Nvidia)
Department of Energy Under Secretary for Science and Genesis Mission lead Darío Gil participated in a session at the Nvidia GPU Technology Conference on March 17 that coincided with the announcement of the DOE’s $293 million Genesis Mission request for applications, which invites interdisciplinary teams to submit ideas for projects addressing over 20 of Genesis’s stated national challenges, several of which focus on accelerating nuclear research and nuclear energy output.
“We seek breakthrough ideas and novel collaborations leveraging the scientific prowess of our national laboratories, the private sector, universities, and science philanthropies,” said Gil.
J. M. Carmona, K. J. McCarthy, V. Tribaldos, R. Balbín
Fusion Science and Technology | Volume 54 | Number 4 | November 2008 | Pages 962-969
Technical Paper | doi.org/10.13182/FST08-A1911
Articles are hosted by Taylor and Francis Online.
First impurity ion temperature profiles obtained using an active diagnostic system, recently installed on the TJ-II stellarator, are presented. This diagnostic consists of a multichannel spectrometer and a compact diagnostic neutral beam injector system optimized for performing charge-exchange recombination spectroscopy. Here, after summarizing the experimental setup, details of the system alignment and calibration, as well as the data analysis method adopted, are presented. Next, impurity ion temperature profiles, determined from C VI emission line widths (at 529.06 nm), are presented for a range of plasma conditions (different densities plus two injected electron cyclotron resonance heating powers) in order to highlight the system capabilities. Then, the comportment of core impurity ion temperature for an electron density scan (4 × 1018 to 9 × 1018 m-3) is examined. It reveals a clear minimum between <ne> = 6 × 1018 and 8 × 1018 m-3 that coincides with the values for the transition from the electron-to-ion root of the radial electric field. Finally, these results are compared with ion temperatures determined by passive methods to evaluate the system performance, and the physics behind the observed impurity ion temperature behavior is examined.