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2025 ANS Winter Conference & Expo
November 9–12, 2025
Washington, DC|Washington Hilton
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October 2025
Latest News
Empowering the next generation: ANS’s newest book focuses on careers in nuclear energy
A new career guide for the nuclear energy industry is now available: The Nuclear Empowered Workforce by Earnestine Johnson. Drawing on more than 30 years of experience across 16 nuclear facilities, Johnson offers a practical, insightful look into some of the many career paths available in commercial nuclear power. To mark the release, Johnson sat down with Nuclear News for a wide-ranging conversation about her career, her motivation for writing the book, and her advice for the next generation of nuclear professionals.
When Johnson began her career at engineering services company Stone & Webster, she entered a field still reeling from the effects of the Three Mile Island incident in 1979, nearly 15 years earlier. Her hiring cohort was the first group of new engineering graduates the company had brought on since TMI, a reflection of the industry-wide pause in nuclear construction. Her first long-term assignment—at the Millstone site in Waterford, Conn., helping resolve design issues stemming from TMI—marked the beginning of a long and varied career that spanned positions across the country.
H. Huang, R. B. Stephens, S. A. Eddinger
Fusion Science and Technology | Volume 59 | Number 1 | January 2011 | Pages 39-45
Technical Paper | Nineteenth Target Fabrication Meeting | doi.org/10.13182/FST59-39
Articles are hosted by Taylor and Francis Online.
High image resolution ([approximately]1.3 m/pixel) and precision positioning capability make the Xradia X-ray microscopy an attractive platform on which to study X-ray opacity variations. It can complement precision radiography (PR) as an instrument with much higher spatial resolution. PR measures X-ray transmission intensity variations down to 0.01% at 100-m resolution. Since the requirement to differentiate minute lateral variations in X-ray transmission intensity scales inversely with the spatial resolution, an X-ray imaging microscope such as the Xradia MicroXCT can be useful if it measures the transmission intensity variations to <1%. In normal practice, a number of imaging artifacts limit the intensity measurement to only [approximately]2% precision. Such artifacts include the thermal drift and the illumination uniformity of the X-ray source, as well as thickness variations in the scintillator plate and the beryllium X-ray tube window. The conventional flat-fielding technique is not effective against the dynamic interaction between the beryllium window texture and the moving shadow cast by a moving X-ray spot. We have modified the image processing routine so that the lateral variations in the transmitted intensity can be measured to [approximately]0.3% precision on low-Z samples. This technique can be used to record microstructure variations in beryllium samples. Currently, the beryllium microstructures are characterized by ultrasmall angle X-ray scattering on a synchrotron source, which is not commonly accessible, is expensive, and has a long turnaround time. This Xradia-based method has the potential to make it a routine measurement.
