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General Kenneth Nichols and the Manhattan Project
Nichols
The Oak Ridger has published the latest in a series of articles about General Kenneth D. Nichols, the Manhattan Project, and the 1954 Atomic Energy Act. The series has been produced by Nichols’ grandniece Barbara Rogers Scollin and Oak Ridge (Tenn.) city historian David Ray Smith. Gen. Nichols (1907–2000) was the district engineer for the Manhattan Engineer District during the Manhattan Project.
As Smith and Scollin explain, Nichols “had supervision of the research and development connected with, and the design, construction, and operation of, all plants required to produce plutonium-239 and uranium-235, including the construction of the towns of Oak Ridge, Tennessee, and Richland, Washington. The responsibility of his position was massive as he oversaw a workforce of both military and civilian personnel of approximately 125,000; his Oak Ridge office became the center of the wartime atomic energy’s activities.”
T. Tokuzawa, K. Kawahata, Y. Nagayama, S. Inagaki, P. C. De Vries, A. Mase, Y. Kogi, Y. Yokota, H. Hojo, K. Tanaka, A. Ejiri, R. O. Pavlichenko, S. Yamaguchi, T. Yoshinaga, D. Kuwahara, Z. Shi, H. Tsuchiya, Y. Ito, S. Hirokura, S. Sudo, A. Komori, LHD Experiment Group
Fusion Science and Technology | Volume 58 | Number 1 | July-August 2010 | Pages 364-374
Chapter 8. Diagnostics | Special Issue on Large Helical Device (LHD) | doi.org/10.13182/FST10-A10822
Articles are hosted by Taylor and Francis Online.
Several types of microwave diagnostics, in the category of electron cyclotron emission (ECE) spectroscopy and reflectometry, have been developed on the Large Helical Device (LHD). Since LHD has a complicated magnetic configuration, the polarization effects have been studied for optimization of the microwave passive and active diagnostics. It was found that if the density is sufficiently high, the effect of mode conversion is negligible and the local polarization angle can be estimated as the angle at the plasma boundary. Three types of ECE spectroscopy, which are the heterodyne radiometer, the Michelson spectrometer, and the grating polychromator, have been optimized and operated routinely in order to measure radial profiles of electron temperature and its fluctuations in the frequency range 50 to 500 GHz. Several types of microwave reflectometers have also been utilized for measurements of the electron density profile and fluctuations. Two ultrashort pulsed radar reflectometers for density profile measurements, a V-band frequency-hopping reflectometer for density fluctuation profile measurements, and a fixed-frequency three-channel homodyne reflectometer for the interlock system of the neutral beam injection have been routinely operated. Also, an advanced diagnostic, which uses an imaging technique, has been developed to study the two- or three-dimensional structure of temperature and density fluctuations.