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Feasibility Study for a Proposed Subcritical Assembly at Oak Ridge National Laboratory

Douglas G. Bowen (Oak Ridge National Laboratory)

VADER: A Tool for Criticality Safety Validation

Justin B. Clarity (Oak Ridge National Laboratory), Shane W. Hart (Oak Ridge National Laboratory), William Wieselquist (Oak Ridge National Laboratory), William J. Marshall (Oak Ridge National Laboratory)

Updated Primers Generated for SCALE 6.2 for KENO V.a and KENO-VI

Kursat B. Bekar (Oak Ridge National Laboratory), Justin B. Clarity (Oak Ridge National Laboratory), Mathieu Dupont (Oak Ridge National Laboratory), Robert A. Lefebvre (Oak Ridge National Laboratory), William J. Marshall (Oak Ridge National Laboratory), Ellen M. Saylor (Oak Ridge National Laboratory)

Improved Runtime Performance in KENO-VI Models Using Arrays and Holes

William J. Marshall (Oak Ridge National Laboratory), Bret D. Brickner (Holtec International)

The Need for a Maximum Intensity Accident in ANS 8-Series Standards

Timothy Jackson (Y-12), James Yugo (Y-12), Jeff Goodman (Y-12)


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